Unique Amplifier and Impedance-Matching Design Tools

Ampsa provides its customers with a structured process for designing robust high performance RF and microwave amplifiers. Transistors are modelled by using S-parameters and IV-curves. Power parameters are used to provide load-pull capabilities in the ADW. (The intrinsic load terminations are controlled in the ADW.) Clipping theory has been developed to a fully useful form in the ADW. Design features include power contours with maximum efficiency lines, as well as second harmonic clipping contours and continuous mode options.

The modeling approach in the ADW is ideal when an accurate  non-linear model is not yet available for a transistor. When a model is available, the ADW model can be fine-tuned by comparing the results obtained.

Sophisticated optimization is provided in the ADW - This includes analysis and optimization for non-linear C_ds.

Impedance matching in the Amplifier Design Wizard and the Matching Wizard is based on systematic searches on the transformation Qs, or systematic searches on the transmission delay and the associated design parameter.

Training can be provided on the software, as well as amplifier design in general and the wizards can be customized to improve the design flow for specific customers.

In addition to the option to buy a permanent license for the ADW, annual subscription options are now also provided (see the price lists provided under Downloads). 

32-bit, as well as 64-bit versions of the ADW and the MW are available.

Version 20 of the ADW has been released. When commensurate distributed matching networks are synthesized in the ADW, the line lengths are fixed by the user and the line widths are the variables. The line widths are fixed in non-commensurate networks, and the line lengths are the variables. In the new version a search can now be performed on the main-line line length (commensurate solutions) or characteristic impedance (non-commensurate solutions). This eliminates manual experimentation to find the best solution to a matching problem.